Shiken is the publication of JALT’s TEVAL SIG.
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Issue DOI: https://doi.org/10.37546/JALTSIG.TEVAL27.2
Table of contents
1. Language testing in changing times: An interview with Professor Daniel Isbell
Edward Schaefer and Jeffrey Martin
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6. Conducting a Rasch Analysis in jMetrik
Trevor A. Holster
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